IEC 60747-9:2007 Withdrawn
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
Abstract
This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).
The major changes with respect to the previous edition are mainly of an editorial nature.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2007-09-26 |
Withdrawal date | 2019-11-13 |
Edition | 2.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
ICS | 31.080.30 - Transistors 31.080.01 - Semiconductor devices in general |
Stability date | 2019 |
Pages | 117 |
File size | 1664 KB |
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