IEC TS 62607-6-11:2022
Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
Abstract
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2022-02-08 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 113 - Nanotechnology for electrotechnical products and systemsrss |
ICS | 07.120 - Nanotechnologies |
Stability date | 2024 |
Pages | 27 |
File size | 1730 KB |
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