IEC 60748-23-2:2002 

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

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Abstract

Applies to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elements used for microelectronic applications including r.f./microwave. These tests will normally be used on microelectronic devices prior to capping or encapsulation to detect and eliminate devices with internal non-conformances that could lead to device failure in normal application. They may also be employed on a sampling basis to determine the effectiveness of the manufacturers' quality control and handling procedures.

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Additional information

Publication typeInternational Standard
Publication date2002-05-23
Edition1.0
Available language(s)English
TC/SCTC 47/SC 47A - Integrated circuitsrss
ICS31.200 - Integrated circuits. Microelectronics
Stability date  2021
Pages97
File size889 KB

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