IEC 60749-1:2002 

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

CHF 

Do you need a multi-user copy?

CHF 

Preview

Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Look inside


Additional information

Publication typeInternational Standard
Publication date2002-08-30
Edition1.0
Available language(s)English/French, Spanish
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2021
Pages15
File size330 KB

Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). The following credit cards are accepted: American express, Mastercard and Visa. Request a pro forma to pay by bank transfer.


Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.