IEC 60749-1
IEC 60749-1:2002
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
The contents of the corrigendum of August 2003 have been included in this copy.
The contents of the corrigendum of August 2003 have been included in this copy.
CHFÂ 20.-
Technical committee
TC 47 Semiconductor devicesCategory
Quality Assurance| Publication type | International Standard |
| Publication date | 2002-08-30 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 2831865492 |
| Pages | 15 |
| File size | 322.14 KB |
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