IEC 60749-1:2002 

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

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Abstract

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

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Additional information

Publication typeInternational Standard
Publication date2002-08-30
Edition1.0
Available language(s)English/French, Spanish
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2029
Pages15
File size330 KB

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