IEC 60749-10:2002/COR1:2003 Withdrawn
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Abstract
Modification of the validity date: now put at 2007.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2003-08-13 |
Withdrawal date | 2022-04-27 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2022 |
File size | 83 KB |
The following test report forms are related:
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