IEC 60749-12:2002 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Abstract
Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2002-04-30 |
Withdrawal date | 2017-12-13 |
Edition | 1.0 |
Available language(s) | English/French, Spanish |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2017 |
Pages | 7 |
File size | 367 KB |
The following test report forms are related:
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