IEC 60749-13:2002 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Abstract
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2002-04-12 |
Withdrawal date | 2018-02-15 |
Edition | 1.0 |
Available language(s) | English/French, Spanish |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2018 |
Pages | 9 |
File size | 416 KB |
The following test report forms are related:
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