IEC 60749-17:2003 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Abstract
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2003-02-20 |
| Withdrawal date | 2019-03-27 |
| Edition | 1.0 |
| Available language(s) | English/French, Spanish |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2019 |
| Pages | 11 |
| File size | 352 KB |
The following test report forms are related:
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