IEC 60749-18:2002 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Abstract
Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source.
Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects.
It is intended for military- and space-related applications.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2002-12-13 |
Withdrawal date | 2019-04-10 |
Edition | 1.0 |
Available language(s) | English/French, Spanish |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2019 |
Pages | 27 |
File size | 489 KB |
The following test report forms are related:
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