IEC 60749-2
IEC 60749-2:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Modification of the validity date: now put at 2007.
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Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2003-08-12 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| File size | 58.53 KB |
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