IEC 60749-23:2004 

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Note: a more recent version of this publication exists
IEC 60749-23:2004+AMD1:2011 CSV


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This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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Additional information

Publication typeInternational Standard
Publication date2004-02-23
Available language(s)English/French, Spanish
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2025
File size388 KB

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