IEC 60749-24
IEC 60749-24:2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
CHFÂ 40.-
Technical committee
TC 47 Semiconductor devicesCategory
Environment - Quality Assurance - Safety| Publication type | International Standard |
| Publication date | 2004-03-09 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2026 |
| ISBN number | 2831883148 |
| Pages | 19 |
| File size | 879.88 KB |
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