Consolidated version
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IEC 60749-27:2006+AMD1:2012 CSV
IEC 60749-27
IEC 60749-27:2006/AMD1:2012
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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Consolidated version
The content of amendment(s) is incorporated into the publication. The track changes mode shows where the publication has been modified by the amendment.
DiscoverTechnical committee
TC 47 Semiconductor devicesCategory
Electromagnetic Compatibility - Quality Assurance| Publication type | International Standard |
| Publication date | 2012-09-25 |
| Edition | 2.0 |
| ICS | 31.080.01 |
| Stability date | 2030 |
| ISBN number | 9782832203415 |
| Pages | 5 |
| File size | 838.64 KB |
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