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IEC 60749-27:2006+AMD1:2012 CSV
IEC 60749-27
IEC 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
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Consolidated version
The content of amendment(s) is incorporated into the publication. The track changes mode shows where the publication has been modified by the amendment.
DiscoverTechnical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2006-07-18 |
| Edition | 2.0 |
| ICS | 31.080.01 |
| Stability date | 2030 |
| ISBN number | 283188716X |
| Pages | 25 |
| File size | 500.22 KB |
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