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IEC 62951-7

IEC 62951-7:2019
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
IEC 62951-7:2019 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin-film layer with ultra‑low permeation rate under both flat and bending conditions. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.
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Technical committee

TC 47 Semiconductor devices
Publication typeInternational Standard
Publication date2019-02-27
Edition1.0
ICS

31.080.99

Stability date2026
ISBN number9782832266120
Pages28
File size1.43 MB
EditionDatePublicationEditionStatus
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