IEC 60749-31
IEC 60749-31:2002
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
The contents of the corrigendum of August 2003 have been included in this copy.
The contents of the corrigendum of August 2003 have been included in this copy.
CHFÂ 20.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2002-08-30 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 2831865573 |
| Pages | 9 |
| File size | 279.48 KB |
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