IEC 60749-31:2002/COR1:2003 

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

English/French
CHF 

Abstract

Modification of the validity date: now put at 2007.

Additional information

Publication typeInternational Standard
Publication date2003-08-13
Edition1.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2021
File size62 KB

The following test report forms are related:



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