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IEC 60749-32:2002+AMD1:2010 CSV
IEC 60749-32
IEC 60749-32:2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. The contents of the corrigendum of August 2003 have been included in this copy.
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Consolidated version
The content of amendment(s) is incorporated into the publication. The track changes mode shows where the publication has been modified by the amendment.
DiscoverTechnical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2002-08-30 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2026 |
| ISBN number | 2831865581 |
| Pages | 9 |
| File size | 294.15 KB |
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