IEC 60749-32 Consolidated version
IEC 60749-32:2002+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.
CHFÂ 50.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2010-11-29 |
| Edition | 1.1 |
| ICS | 31.080.01 |
| Stability date | 2026 |
| ISBN number | 9782889122349 |
| Pages | 9 |
| File size | 866.10 KB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation