IEC 60749-33
IEC 60749-33:2004
Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.
CHFÂ 40.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2004-03-09 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 2831883156 |
| Pages | 17 |
| File size | 854.22 KB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation