IEC 60749-36:2003 

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state


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Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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Additional information

Publication typeInternational Standard
Publication date2003-02-13
Available language(s)English/French, Spanish
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2024
File size179 KB

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