IEC 60749-36
IEC 60749-36:2003
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
CHFÂ 10.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2003-02-13 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 2831868580 |
| Pages | 7 |
| File size | 174.32 KB |
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