IEC 60749-6:2002 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Abstract
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
The contents of the corrigendum of August 2003 have been included in this copy.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2002-04-12 |
| Withdrawal date | 2017-03-03 |
| Edition | 1.0 |
| Available language(s) | English/French, Spanish |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2017 |
| Pages | 7 |
| File size | 373 KB |
The following test report forms are related:
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