IEC 60749-8
IEC 60749-8:2002
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.
The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
The contents of the corrigenda of April 2003 and August 2003 have been included in this copy.
CHFÂ 80.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2002-08-30 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 283186559X |
| Pages | 31 |
| File size | 580.56 KB |
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