IEC 60747-18-1:2019
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Abstract
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2019-05-20 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
| ICS | 31.080.99 - Other semiconductor devices |
| Stability date | 2027 |
| Pages | 26 |
| File size | 2418 KB |
The following test report forms are related:
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