IEC 60759:1983 

Standard test procedures for semiconductor X-ray energy spectrometers

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Abstract

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

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Additional information

Publication typeInternational Standard
Publication date1983-01-01
Edition1.0
Available language(s)English/French
TC/SCTC 45 - Nuclear instrumentationrss
ICS17.240 - Radiation measurements
Stability date  2021
Pages97
File size4191 KB

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