IEC 60759
IEC 60759:1983
Standard test procedures for semiconductor X-ray energy spectrometers
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
CHFÂ 280.-
Technical committee
TC 45 Nuclear instrumentation| Publication type | International Standard |
| Publication date | 1983-01-01 |
| Edition | 1.0 |
| ICS | 17.240 |
| Stability date | 2029 |
| ISBN number | 2831809274 |
| Pages | 97 |
| File size | 4.00 MB |
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