IEC 62969-4
IEC 62969-4:2018
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
CHFÂ 115.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2018-06-18 |
| Edition | 1.0 |
| ICS | 31.080.99 |
| Stability date | 2026 |
| ISBN number | 9782832257913 |
| Pages | 39 |
| File size | 1.37 MB |
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