IEC 61164:2004 

Reliability growth - Statistical test and estimation methods

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Abstract

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example.

This publication is to be read in conjunction with IEC 61014:2003.

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Additional information

Publication typeInternational Standard
Publication date2004-03-24
Edition2.0
Available language(s)English, English/French, Spanish
TC/SCTC 56 - Dependabilityrss
ICS03.120.01 - Quality in general
03.120.30 - Application of statistical methods
Stability date  2021
Pages111
File size1659 KB

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