IEC 61445:2012 

Digital Test Interchange Format (DTIF)


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IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

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Additional information

Publication typeInternational Standard
Publication date2012-06-21
Available language(s)English
TC/SCTC 91 - Electronics assembly technologyrss
ICS25.040.01 - Industrial automation systems in general
35.060 - Languages used in information technology
Stability date  2026
File size2848 KB

The following test report forms are related:

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