IEC 61445:2012
Digital Test Interchange Format (DTIF)
Abstract
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2012-06-21 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 91 - Electronics assembly technologyrss |
| ICS | 25.040.01 - Industrial automation systems in general 35.060 - Languages used in information technology |
| Stability date | 2026 |
| Pages | 101 |
| File size | 2848 KB |
The following test report forms are related:
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