IEC 60068-2-82:2007 Withdrawn
Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components
Abstract
IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress.
This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable.
The contents of the corrigendum of December 2009 have been included in this copy.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2007-05-23 |
Withdrawal date | 2019-05-14 |
Edition | 1.0 |
Available language(s) | English, English/French, Spanish |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 19.040 - Environmental testing |
Stability date | 2019 |
Pages | 66 |
File size | 2685 KB |
The following test report forms are related:
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