IEC 61788-17:2013 

Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films

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Abstract

IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m.

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Additional information

Publication typeInternational Standard
Publication date2013-01-16
Edition1.0
Available language(s)English/French
TC/SCTC 90 - Superconductivityrss
ICS17.220.20 - Measurement of electrical and magnetic quantities
29.050 - Superconductivity and conducting materials
Stability date  2021
Pages93
File size2726 KB

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