IEC 63150-1:2019
Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
Abstract
IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2019-05-10 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.99 - Other semiconductor devices |
Stability date | 2025 |
Pages | 74 |
File size | 10020 KB |
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