IEC 60749-4:2016 PRV
Pre release version
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)
AbstractThis Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2016-12-23 to 2017-02-03. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.
IEC 60749-4 Ed.2.0 (E) provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
This edition includes the following significant technical changes with respect to the previous edition:
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.
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