IEC 60749-4:2016 PRV 
Pre release version

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp Heat, steady state, highly accelerated stress test (HAST)

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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2016-12-23 to 2017-02-03. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60749-4 Ed.2.0 (E) provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

This edition includes the following significant technical changes with respect to the previous edition:
a)   clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b)   recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c)   allowance of additional time-to-test delay or return-to-stress delay.

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Additional information

Publication typeInternational Standard
Publication date2016-12-23
Edition2.0
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date2022
Hardcopy9  pages
File size994 KB

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