IEC TS 62607-5-3:2020
Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
Abstract
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.
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Additional information
| Publication type | Technical Specification |
|---|---|
| Publication date | 2020-04-14 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 113 - Nanotechnology for electrotechnical products and systemsrss |
| ICS | 07.030 - Physics. Chemistry
07.120 - Nanotechnologies |
| Stability date | 2025 |
| Pages | 20 |
| File size | 1736 KB |
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