IEC TS 62607-5-3:2020 

Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

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Abstract

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

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Additional information

Publication typeTechnical Specification
Publication date2020-04-14
Edition1.0
Available language(s)English
TC/SCTC 113 - Nanotechnology for electrotechnical products and systemsrss
ICS07.030 - Physics. Chemistry
07.120 - Nanotechnologies
Stability date  2022
Pages20
File size1736 KB

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