IEC 62373-1
IEC 62373-1:2020
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET
IEC 62373-1:2020 provides the measurement procedure for a fast BTI (bias temperature instability) test of silicon based metal-oxide semiconductor field-effect transistors (MOSFETs).
This document also defines the terms pertaining to the conventional BTI test method.
This document also defines the terms pertaining to the conventional BTI test method.
CHFÂ 155.-
Technical committee
TC 47 Semiconductor devicesCategory
Quality Assurance| Publication type | International Standard |
| Publication date | 2020-07-15 |
| Edition | 1.0 |
| ICS | 31.080.30 |
| Stability date | 2031 |
| ISBN number | 9782832286104 |
| Pages | 44 |
| File size | 1.67 MB |
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