IEC 60749-43:2017 PRV
Pre release version
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
AbstractThis Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2017-04-14 to 2017-05-26. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
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