IEC 60749-43:2017 PRV 
Pre release version

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2017-04-14 to 2017-05-26. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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Additional information

Publication typeInternational Standard
Publication date2017-04-14
Edition1.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2023
Pages76
File size1617 KB

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