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IEC Technical Report 63133

IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
BASE PUBLICATION
English
  CHF 115.-

Technical committee

TC 47 Semiconductor devices
Publication typeTechnical Report
Publication date2017-10-11
Edition1.0
ICS

31.080.01

Stability date2031
ISBN number9782832249031
Pages17
File size1.71 MB
EditionDatePublicationEditionStatus

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