IEC TR 63133:2017
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
Abstract
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
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Additional information
| Publication type | Technical Report |
|---|---|
| Publication date | 2017-10-11 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2025 |
| Pages | 17 |
| File size | 1792 KB |
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