IEC TR 63133:2017 

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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Abstract

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

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Additional information

Publication typeTechnical Report
Publication date2017-10-11
Edition1.0
Available language(s)English
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2022
Pages17
File size1792 KB

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