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IEC Technical Specification 61945

IEC TS 61945:2000
Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
BASE PUBLICATION
English/French
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Technical committee

TC 47/SC 47A Integrated circuits
Publication typeTechnical Specification
Publication date2000-03-10
Edition1.0
ICS

31.200

Stability date2027
ISBN number2831850649
Pages23
File size92.37 KB
EditionDatePublicationEditionStatus

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