IEC TS 61945:2000 

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

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Abstract

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

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Additional information

Publication typeTechnical Specification
Publication date2000-03-10
Edition1.0
Available language(s)English/French
TC/SCTC 47/SC 47A - Integrated circuitsrss
ICS31.200 - Integrated circuits. Microelectronics
Stability date  2022
Pages23
File size95 KB

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