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IEC 60749-18:2019 RLV
IEC 60749-18
IEC 60749-18:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.
CHFÂ 155.-
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DiscoverTechnical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2019-04-10 |
| Edition | 2.0 |
| ICS | 31.080.01 |
| Stability date | 2030 |
| ISBN number | 9782832267554 |
| Pages | 44 |
| File size | 1.59 MB |
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