Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Note: a redline version of this publication exists
IEC 60749-18:2019 RLV
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.
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