IEC 62951-7:2018 PRV
Pre release version
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
IEC 62951-7:2018 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin film layer with ultra‑low permeation rate under both flat and bending conditions. This high performance barrier layer is applicable to the organic semiconductor devices, including flexible organic electronics such as organic thin film transistors and organic diodes. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. High performance thin film barrier layers with ultra‑low permeation rate are generally used to encapsulate organic devices for long-term reliability. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.
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