IEC 62951-7:2018 PRV 
Pre release version

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor


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This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2018-12-21 to 2019-02-01. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 62951-7 ED1 specifies evaluation conditions and gives a method of measurement as well as a test set-up for the measurement of barrier performance for thin film layer with ultra‑low permeation rate under both flat and bending conditions. This high performance barrier layer is applicable to the organic semiconductor devices, including flexible organic electronics such as organic thin film transistors and organic diodes. This document also includes the preparation of specimen, electrical contacts, sensor films and calculation procedures. High performance thin film barrier layers with ultra‑low permeation rate are generally used to encapsulate organic devices for long-term reliability. For these purposes, this document provides terms, definitions, symbols, configurations, and test methods including test conditions such as temperature, relative humidity, testing time.

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Additional information

Publication typeInternational Standard
Publication date2018-12-21
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.99 - Other semiconductor devices
Stability date  2024
File size1503 KB

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