IEC 60749-17:2019 PRV 
Pre release version

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

English/French
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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2019-01-25 to 2019-03-08. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60749-17 ED2 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
  1. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
  2. addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

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Additional information

Publication typeInternational Standard
Publication date2019-01-25
Edition2.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2022
Pages17
File size982 KB

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