IEC 61788-17:2021
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
Note: a redline version of this publication exists
IEC 61788-17:2021 RLV
Abstract
IEC 61788-17:2021 is available as IEC 61788-17:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
- Jcd: from 200 A/m to 32 kA/m (based on results, not limitation).
- Measurement resolution: 100 A/m (based on results, not limitation).
IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
- Jcd: from 200 A/m to 32 kA/m (based on results, not limitation).
- Measurement resolution: 100 A/m (based on results, not limitation).
Look inside
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2021-04-28 |
| Edition | 2.0 |
| Available language(s) | English, English/French |
| TC/SC | TC 90 - Superconductivityrss |
| ICS | 17.220.20 - Measurement of electrical and magnetic quantities
29.050 - Superconductivity and conducting materials |
| Stability date | 2025 |
| Pages | 84 |
| File size | 4115 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.