IEC 60747-18-1:2019 PRV 
Pre release version

Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors

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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2019-02-22 to 2019-04-05. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60747-18-1:2019 specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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Additional information

Publication typeInternational Standard
Publication date2019-02-22
Edition1.0
Available language(s)English
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.080.99 - Other semiconductor devices
Stability date  2024
Pages25
File size2412 KB

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