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IEC 62215-3

IEC 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
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Technical committee

TC 47/SC 47A Integrated circuits

Category

Electromagnetic Compatibility
Publication typeInternational Standard
Publication date2013-07-17
Edition1.0
ICS

31.200

Stability date2026
ISBN number9782832209943
Pages66
File size1.31 MB
EditionDatePublicationEditionStatus
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