IEC 62215-3:2013 

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

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Abstract

IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.

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Additional information

Publication typeInternational Standard
Publication date2013-07-17
Edition1.0
Available language(s)English/French
TC/SCTC 47/SC 47A - Integrated circuitsrss
ICS31.200 - Integrated circuits. Microelectronics
Stability date  2021
Pages66
File size1376 KB

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