IEC 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Abstract
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2013-07-17 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47A - Integrated circuitsrss |
ICS | 31.200 - Integrated circuits. Microelectronics |
Stability date | 2026 |
Pages | 66 |
File size | 1376 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.