IEC 62258-6:2006
Semiconductor die products - Part 6: Requirements for information concerning thermal simulation
Abstract
Determines the information required to facilitate the use of thermal data and models for simulation of the thermal behaviour and verification of the correct functionality of electronic systems that include bare semiconductor die, with or without connection structures, and/or minimally packaged semiconductor die. Intends to assist all those involved in the supply chain for die devices to comply with the requirements of IEC 62258-1 and IEC 62258-2
Additional information
Publication type | International Standard |
---|---|
Publication date | 2006-08-28 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.99 - Other semiconductor devices |
Stability date | 2026 |
Pages | 9 |
File size | 247 KB |
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