IEC 60749-15:2020 PRV 
Pre release version

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2020-05-08 to 2020-06-19. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60749-15:2020 describes a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of their leads by using wave soldering.
In order to establish a standard test procedure for the most reproducible methods, the solder dip method is used because of its more controllable conditions. This procedure determines whether devices are capable of withstanding the soldering temperature encountered in printed wiring board assembly operations, without degrading their electrical characteristics or internal connections. This test is destructive and may be used for qualification, lot acceptance and as a product monitor.
This edition includes the following significant technical changes with respect to the previous edition:

  1. inclusion of new Clause 3, Terms and definitions;
  2. clarification of the use of a soldering iron for producing the heating effect;
  3. inclusion an option to use accelerated ageing.

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Additional information

Publication typeInternational Standard
Publication date2020-05-08
Edition3.0
Available language(s)English
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2025
Pages9
File size945 KB

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