IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
Abstract
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2023-03-29 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2027 |
| Pages | 30 |
| File size | 955 KB |
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