IEC 63287-2
IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
CHFÂ 80.-
Technical committee
TC 47 Semiconductor devicesCategory
Quality Assurance| Publication type | International Standard |
| Publication date | 2023-03-29 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2031 |
| ISBN number | 9782832267080 |
| Pages | 30 |
| File size | 932.15 KB |
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