IEC 62276:2012 Withdrawn
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Abstract
IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2012-10-19 |
| Withdrawal date | 2016-10-24 |
| Edition | 2.0 |
| Available language(s) | English/French |
| TC/SC | TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss |
| ICS | 31.140 - Piezoelectric devices |
| Stability date | 2016 |
| Pages | 82 |
| File size | 1165 KB |
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