IEC 62373
IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
CHFÂ 80.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2006-07-18 |
| Edition | 1.0 |
| ICS | 31.080.30 |
| Stability date | 2031 |
| ISBN number | 2831887143 |
| Pages | 27 |
| File size | 533.90 KB |
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