IEC 62373:2006 

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

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Abstract

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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Additional information

Publication typeInternational Standard
Publication date2006-07-18
Edition1.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.30 - Transistors
Stability date  2025
Pages27
File size547 KB

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