IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Abstract
Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2006-07-18 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.30 - Transistors |
| Stability date | 2025 |
| Pages | 27 |
| File size | 547 KB |
The following test report forms are related:
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