IEC 62415
IEC 62415:2010
Semiconductor devices - Constant current electromigration test
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
CHFÂ 40.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2010-05-19 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2031 |
| ISBN number | 9782889109494 |
| Pages | 22 |
| File size | 926.22 KB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation