IEC 62415:2010 

Semiconductor devices - Constant current electromigration test

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Abstract

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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Additional information

Publication typeInternational Standard
Publication date2010-05-19
Edition1.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2025
Pages22
File size948 KB

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