IEC 62415:2010
Semiconductor devices - Constant current electromigration test
Abstract
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Look inside
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2010-05-19 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2025 |
| Pages | 22 |
| File size | 948 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.